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Optical measurement methods are becoming increasingly important for high-precision production of components and quality assurance. The increasing demand can be met by modern imaging systems with advanced optics, such as light field cameras. This work explores their use in the deflectometric measurement of specular surfaces. It presents improvements in phase unwrapping and calibration techniques, enabling high surface reconstruction accuracies using only a single monocular light field camera.

DETAILS

  • Light Field Imaging for Deflectometry
  • Uhlig, David
  • Kartoniert, 284 S.
  • graph. Darst.
  • Sprache: Englisch
  • 210 mm
  • ISBN-13: 978-3-7315-1306-3
  • Titelnr.: 96951008
  • Gewicht: 540 g
  • KIT Scientific Publishing (2023)
  • Herstelleradresse

    KIT Scientific Publishing

    Strasse am Forum 2

    76131 - DE Karlsruhe

    E-Mail: info@ksp.kit.edu

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